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Research Article Open Access

Seismic Refraction Method: A Technique for Determining the Thickness of Stratified Substratum

Ochuko Anomohanran1
  • 1 Department of Physics, Faculty of Science, Delta State University, Abraka, Delta State, Nigeria

Abstract

The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics. This is why this study was carried out to emphasize the ability of the seismic refraction method in determining the thickness of stratified layers of soil and rock. The results obtained are generalized expressions that relate travel time, offset distance, velocity and thickness of subsurface layers.

American Journal of Applied Sciences
Volume 10 No. 8, 2013, 857-862

DOI: https://doi.org/10.3844/ajassp.2013.857.862

Submitted On: 9 March 2013 Published On: 24 July 2013

How to Cite: Anomohanran, O. (2013). Seismic Refraction Method: A Technique for Determining the Thickness of Stratified Substratum. American Journal of Applied Sciences, 10(8), 857-862. https://doi.org/10.3844/ajassp.2013.857.862

Open AccessCopyright: © 2013 Ochuko Anomohanran. This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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Keywords

  • Seismic Refraction
  • Direct Arrivals
  • Geophones
  • Seismograph